Asset Details
- Identifier:
- macp201900121-fig-0004
- Description:
- AFM height images of PSA thin films on silicon wafers after different degradation times (sample thickness at 0 h: 166 nm). Scale bars: 1 µm. Roughness values Rq are given underneath the images. Left to right: a) at 0 h, b) 2 h, c) 24 h, and d) 48 h.
- License:
- Rights Managed
- Rights Holder:
- John Wiley & Sons, Inc.
- License Rights Holder:
- © 2019 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim
- Asset Type:
- Image
- Asset Subtype:
- Figure
- Image Orientation:
- Landscape
- Image Dimensions:
- 1000 x 244
- Image File Size:
- 254 KB
- Creator:
- Zhuoling Deng, Alexander Schweigerdt, Alexander Norow, Karen Lienkamp
- Credit:
- Deng, Z., Schweigerdt, A., Norow, A., & Lienkamp, K. (2019). Degradation of Polymer Films on Surfaces: A Model Study with Poly(sebacic anhydride) Macromolecular Chemistry and Physics, 220(15), n/a. https://doi.org/10.1002/macp.201900121.
- Collection:
- Keywords:
- Restrictions:
- Property Release:
- No
- Model Release:
- No
- Purchasable:
- Yes
- Sensitive Materials:
- No
- Article Authors:
- Zhuoling Deng, Alexander Schweigerdt, Alexander Norow, Karen Lienkamp
- Article Copyright Year:
- 2019
- Publication Title:
- Macromolecular Chemistry and Physics
- Publication Volume:
- 220
- Publication Issue:
- 15
- Publication Date:
- 08/01/2019
- DOI:
- https://doi.org/10.1002/macp.201900121
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