Asset Details

  • Description:
  • Estimated parameters of mean μ and standard deviation σ of the fitted Gaussian distributions
  • License:
  • Rights Managed
  • Rights Holder:
  • John Wiley & Sons, Inc.
  • License Rights Holder:
  • © 2020 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim
  • Asset Type:
  • Image
  • Asset Subtype:
  • Table
  • Image Orientation:
  • Landscape
  • Image Dimensions:
  • 1024 x 342
  • Image File Size:
  • 83.2 KB
  • Creator:
  • Zhi‐Lei Wang, Toshio Ogawa, Yoshitaka Adachi
  • Credit:
  • Wang, Z.-L., Ogawa, T., & Adachi, Y. (2020). Machine‐Learning‐Based Image Similarity Analysis for Use in Materials Characterization. Advanced Theory and Simulations, 3(3), n/a. https://doi.org/10.1002/adts.201900237.
  • Collection:
  • Keywords:
  • Restrictions:
  • Property Release:
  • No
  • Model Release:
  • No
  • Purchasable:
  • Yes
  • Sensitive Materials:
  • No
  • Article Authors:
  • Zhi‐Lei Wang, Toshio Ogawa, Yoshitaka Adachi
  • Article Copyright Year:
  • 2020
  • Publication Volume:
  • 3
  • Publication Issue:
  • 3
  • Publication Date:
  • 03/01/2020
  • DOI:
  • https://doi.org/10.1002/adts.201900237

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